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Introducing a reliable test and performance sample for your scanning
electron microscope. This specimen is vapor deposited aluminum on a
silicon substrate, photo lithographed and etched, with sufficient information
to do at least ten important measurements and tests.
Dimensions are printed near each target area. Durability and dimensional
stability are excellent and maintainance is easy. Specimens are shipped
ready for mounting and vapor coating. Your specimen may also be mounted
on your sample holder compared to NIST SEM sample type SRM484. Complete
instructions with each order. |

Note: Due to image processing and differences in monitors, the image
below may appear distorted.
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